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  • Defect detection based on monogenic signal processing [2019]

    Category:
    Ponencias
    Authors:
    J. Fleuret , C. Ibarra Castanedo , L. Lei , S. Sfarra , Rubén Usamentiaga Fernández , X. Maldague
    Date:
    01 of January of 2019
    It Is a Part of:
    Proceedings of SPIE - The International Society for Optical Engineering