Industrial and Intellectual Property
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Flatness measurement system based on a nonlinear optical triangulation technique [2002]
- Category:
- Artículos
- Authors:
- Valentín Fernández , Faustino Emilio Obeso Carrera , Manuel García Vázquez , Daniel Fernando García Martínez
- Date:
- 01 of January of 2002
- It Is a Part of:
- IEEE Transactions on Instrumentation and Measurement, 51(2)