Industrial and Intellectual Property
-
Defect detection based on monogenic signal processing [2019]
- Category:
- Ponencias
- Authors:
- X. Maldague , Rubén Usamentiaga Fernández , S. Sfarra , L. Lei , C. Ibarra Castanedo , J. Fleuret
- Date:
- 01 of January of 2019
- It Is a Part of:
- Proceedings of SPIE - The International Society for Optical Engineering