Industrial and Intellectual Property

  • Defect detection based on monogenic signal processing [2019]

    Category:
    Ponencias
    Authors:
    X. Maldague , Rubén Usamentiaga Fernández , S. Sfarra , L. Lei , C. Ibarra Castanedo , J. Fleuret
    Date:
    01 of January of 2019
    It Is a Part of:
    Proceedings of SPIE - The International Society for Optical Engineering