Industrial and Intellectual Property

  • Surface Defect System for Long Product Manufacturing Using Differential Topographic Images [2020]

    Category:
    Artículos
    Authors:
    Rubén Usamentiaga Fernández , Daniel Fernando García Martínez , Francisco Javier de la Calle Herrero
    Date:
    01 of January of 2020
    It Is a Part of:
    Sensors